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> Hioki 3541 resistance hitester
Hioki 3541 resistance hitester
HIOKI 3541 RESISTANCE HiTESTERNew in box
Measure from very low (µ-ohm) to very high (M-ohm) resistances with a single instrument
* Wide Measurement Range : 0.1 µ-ohm (20 m-ohm range) to 110.000 M-ohm
* 0.6 ms with 70 ppm precision
* Low-Power Measurement Function
* Comparator and BIN functions
* Measurement Fault Detection
* Offset voltage compensation minimizes thermo-electro-motive effects
* Statistical calculation functions
20.0000 m-ohm to 110.000 M-ohm, 11 ranges
±0.1 %rdg. ±0.015 %f.s. (20 m-ohm range)
±0.1 %rdg. ±0.006 %f.s. (200 m-ohm range)
±0.014 %rdg. ±0.004 %f.s. (2 ohm range)
±0.01 %rdg. ±0.004 %f.s. (20 ohm range)
±0.008 %rdg. ±0.0015 %f.s. (200 ohm range)
±0.007 %rdg. ±0.0015 %f.s. (2 k-ohm and 20 k-ohm range)
±0.007 %rdg. ±0.003 %f.s. (100 k-ohm range)
±0.008 %rdg. ±0.003 %f.s. (1 M-ohm range)
±0.04 %rdg. ±0.006 %f.s. (10 M-ohm range)
±0.2 %rdg. ±0.02 %f.s. (100 M-ohm range)
1A (20 m-ohm and 200 m-ohm range) to 100 nA (100 M-Ohm range)
Low-Power Measurement: 10mA (2 ohm range) to 10 µ-ohm (2 k-ohm range)
0.6 ms (fast mode), 21 ms (medium mode), 155 ms (slow1 mode), 455 ms (slow2 mode)
13 V Max. (100 k-ohm, 100 M-ohm range)
Low-Power Measurement: 60 mV Max.
Temperature correction, Temperature conversion, Self calibration, Measurement fault detection, Overflow detection, Offset voltage compensation, Average, Statistical calculation, Key lock, Save/Load, Comparator, BIN measurement
215 mm(8.46 in)W × 80 mm(3.15 in)H × 295 mm(116.14 in)D, 3.1 kg (91.7 oz)
9287 CLIP-TYPE LEAD(1), 9451 TEMPERATUREPROBE(1), Power cord(1), EXT I/O Male Connector
