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Logue mcdonald 324P digital ic test system
Logue McDonald 324p Digital IC Test System
Specifications may include items that we do not have for this unit. You only get what is in the pictures, if you don't see it you probably wont get it.
We do not have a PC or the software for it.
We believe it is a 324p system because the manual we have says so.
Comes with a User Document Package Manual and a Training Class (March 1993) Manual.
Pro / Test (P/T) IV Unisite (Board Inside):
Pro / Test (P/T) IV Cover Insert:
Pro Test Unisite Interface Module (Additional Unit):
Pro Test Unisite SMT Support Module (Additional Unit):
Pro 2000 Logic Test System - NR/Options=NR
The Logue McDonald Automation 324p digital logic test system consists in its simplest form of the 324p tester, LMA software, and a PC which functions as the system controller. In addition to this there is a multitude of pheripheral devices and software options that may be integrated into the test system to increase functionality and throughput.
As software options and peripherals are added to the test system, the complexity of the installation procedue increases. To simplfy this procedure, this manual is structured to provide step by step instructions for installing each portion of the system.
The Logue McDonald Automation 324p performs complete DC, AC, and functional testing for programmable logic devices (PLDs), including advanced Shottky and advanced CMOS technologies. It is designed for reliable, repeatable, high throughput operating at semiconductor manufacturers, and for incomming inspection and device analysis by PLD end users. It provides complete features for device failure analysis and characterization, as well as high volume production. Third party support included automated test vector generation and translation of test programs from other industry standard ATE systems.
The 324p integrates a 386/486 PC as the system controller. LMA software provides multimode datalogging of any test executed along with full production management functions including batch summaries. Various operating modues are tailored for nontechnical operators, test engineers, product engineers, design engineers, and service technicians.
* 32 Channel AC Measuring System
* 400ps overall automated measurement accuracy
* Constructed from readily available high performance ATE components
* 200ps clock and comparator strobe timing resolution
* On the fly switchable pin electronics: drive, receiver, loads, timing and format
* Quiet passive AC load meet exact device specifications
* Dual 32 channel PMU (DC measuring systems; quad PMU optional
* DC tests: -4V to +12.75V, up to 300mA; resolution to 1 mV, 1nA
* 3 programmable general purpose power supplies
* 8 bin autohandler/wafer prober control interface
* Tests are completely configured by software
* Zero footprint in most applications
Top Level AC Accuracy Specifications:
Unless noted, teh AC measurement specifications in this section are valid at the testhead of the 324uhp-5 for PLD test programgs with ACCS processing.
Driver Edge Rates: 1V/ns preserved through the programmer interface board (PRO/TEST) and the high frequency autohandler contactor.
Driver Minimum Pulse Width: 4ns a 3V amplitude, pulse width measured at 1.5V points.
Driver Over/Under Shoot: 300mV
Programmable Driver: Vih - 3V to 6V with 250mV resolution
Clock: Pulse JEDEC standard C, K (RZ, RO)
Clock Leading/Trailing Edge:
Format to Format Switching on the Fly: Any pin can be programmed as a clock or data driver, float, receiver, or receiver with pullup and/or pulldown AC loads on a vector to vector basis switchable on the fly.
Vector Rate: 1000 Vectors/second minimum; typical overall test time including DC tests is .5 to 4 seconds (7,200 to 900 devices/hour). 50,000 vectors/second with the bus extender option. Maximum vector rate with custom code is 1.5MHz.
Comparator Strobe: Zero dead time on edge placement.
Channel Capacitance: 45 picofarads +/- 5 picofarads.
AC Loads: Pullup/Pulldown resistor pair.
Driver Comparator Alignment: < 400ps
Measurement Accuracy: < 400 ps; includes error attributed to nonlinearity, resolution, and interaction of tester channels and timing generators.
Measurement Jitter: +/- 200ps
Time Search Algorithm: AC functional; binary/linear convergence on edge transition; measurements can be enabled or masked on any vectors, pins, and/or transition types (tPZH, tPZL, tPHZ, tPLZ, tPLH, tPHL)
Top Level DC Accuracy Specifications:
* Force bias voltage or bias current.
* Force voltage, measure current.
* Force current (programmable compliance), measure voltage.
PMU Measuring Systems: 2 standard, 4 optional
Ranges: 10uA, 100uA, 1mA, 10mA, 100mA, 300mA full scale.
Accuracy: +/- 0.1% of full scale, +/- 3LSB counts, except 100mA and 300mA ranges which are +/- 0.5% full scale
Resolution: Fixed by range: 1nA (10uA range) to 100uA (300mA range)
PMU Connections: 1 per channel for each DC system.
Voltage Ranges: -4V, +4V, +12V full scale.
Power Supply Specifications:
Vcc Supply: 0 to 12.750V, 600mA, 50mV programming resolution
Icc Measurements: 2 ranges: 100mA, 300mA full scale (high resolution static Icc tests for CMOS devices are performed by a PMU)
Icc Measurement Accuracy: +/- 0.5% of full scale +/- 3LSB counts
AC Load Supply: 0 to 12.75V, 50mV resolution
Vpp Supply: 0 to 24.50V, 100mV resolution
Power Requirements: 90 to 132 VAC or 180 to 264 VAC, 47 to 440 Hz, 266 watts
